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Home->Product-> Test & Measuring Instruments->Yokogawa Measuring Instruments->
 
 

2553 DC Voltage / Current Standard

 

 

The 2533 is an ultra-stable, high-resolution DC voltage and current source which delivers output voltages from 1 uV to 12V, and output currents from 0.1uA to 120mA at an accuracy of ¡À0.02%

Output voltage and current are set using three dials on the front panel. Setting are controlled by digital signals passing through photo couplers and microprocessors, and are displayed on a red 5-digit LED. It also features the five most commonly used TC ranges conforming to IEC 584-1 standard for calibrating and testing thermocouple thermometers or related devices. Corresponding emf outputs are available by selecting the relevant range and setting the temperature in oC.

The 2553 can be remotely programmed and controlled using an optional General Purpose Interface Bus (GPIB) that meets the IEEE 4999 standard. This enables the 2553 to be interfaced easily with other instruments and to be applied in a fully automatic calibration or test system.

Features:

  • High accuracy of output - ¡À0.02% on all ranges
  • emf output for 5 thermocouple types conforming to IEC 584-1
  • Output divider from 1 to 15 divisions
    The OUTPUT DIVIDER divides any voltage and current setting from 1 up to 15. This function is invaluable for calibration, testing or adjustment of most meters of non-decade ranges.
  • Non-contact output setting for long-term reliable operation
    The 2553 completely eliminates switch and relay contact problems. Output voltage, current and emf are set using optical couplers.
  • Easy-to-read, red LED display
  • Fully protected against overload and short circuits
    The maximum output voltage and current are automatically limited to prevent damage to the circuitry in the event of accidental short circuits.
  • GPIB-programmable with optional IEEE interface
    The output range, polarity, voltage, current and output ON/OFF are remotely programmable to facilitate system interface. (IEEE488 standard)
  • Optional semiconductor probe with built-in reference junction compensator
 


 

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